“Resistivity Measurements of Epitaxial Silicon Layers”, 1962
File — Box: 0363.01, Item: 05
Scope and Contents
Notis and E. J. Saukulak “Resistivity Measurements of Epitaxial Silicon Layers” [Technical Memorandum to Western Electric Co., Inc. outlines the results of a study of the use of Four Point Probe Resistivity Measurements for Epitaxial Silicon Slices]
Dates
- Creation: 1962
Creator
- From the Collection: Notis, Michael Richard, 1938- (Person)
Access Restrictions
Access Restrictions: Collection housed remotely. Users need to contact 24 hours in advance.
Extent
From the Collection: 1.5 Linear Feet (3 boxes)
Language of Materials
From the Collection: English
Repository Details
Part of the Lehigh University Special Collections Repository
Contact:
Lehigh University
Linderman Library
30 Library Drive
Bethlehem PA 18045 USA
610-758-4506
610-758-6091 (Fax)
inspc@lehigh.edu
Lehigh University
Linderman Library
30 Library Drive
Bethlehem PA 18045 USA
610-758-4506
610-758-6091 (Fax)
inspc@lehigh.edu