I-beam test: overhead view of I-beam in testing apparatus; view of surrounding lab with subject standing at machine; negative has two strips of black tape on back essentially cropping image to 1/3 of original size, no date

I-beam test: overhead view of I-beam in testing apparatus; view of surrounding lab with subject standing at machine; negative has two strips of black tape on back essentially cropping image to 1/3 of original size, no date, Item: 701; Box: 1; Folder: 33.5. Negatives and Photographs of Fritz Engineering Laboratory Tests and Events, SC Photo 0013. Lehigh University Grant Projects. https://archivesspace.lib.lehigh.edu//repositories/7/archival_objects/71114 Accessed March 22, 2025.