Box 0363.01

The collection contains documents that related to Prof. Notis’s research in metallurgy, including studying ancient tools, traditional Japanese and Chinese metal work, etc. Documents include published papers, pictorial and textual data about laboratory research, historical information about Biblical archeology; published theses and eight books.

The collection contains documents that related to Prof. Notis’s research in metallurgy, including studying ancient tools, traditional Japanese and Chinese metal work, etc. Documents include published papers, pictorial and textual data about laboratory research, historical information about Biblical archeology; published theses and eight books.

“Survey of Work Done on the Deposition of Thin Germanium Films by Thermal Decomposition of GeCl4, Memorandum for Record, November 21.

“Preliminary Draft of Specification on Thickness Measurement by Infrared Reflectance” [To Members ASTM Task Force on Epitaxial Materials]

Notis and E. J. Saukulak “Resistivity Measurements of Epitaxial Silicon Layers” [Technical Memorandum to Western Electric Co., Inc. outlines the results of a study of the use of Four Point Probe Resistivity Measurements for Epitaxial Silicon Slices]

“Diffusion Measurement Techniques for Elemental Semiconductors” [Term Paper Met. 416 Atom Movements]

“The Effects of Imperfections on Semiconductor Properties and Device Parameters - A Literature Review” [Memorandum presents a literature review of the effects of crystallographic imperfections on semi- conductor properties and device properties]

“Stacking Faults in Epitaxial Silicon Thin Films” [M.S. Thesis and related correspondence]

Notis and G. P. Conard “Effect of Growth Rate on Stacking-Fault Density in Epitaxial Silicon Layers’ [2 copies Reprinted from Journal of Applied Physics, Vol. 35, No. 3, March 1964 and Western Electric Company Technical Papers Second Quarter 1964]

“Thermodynamic Evaluation of Silicon Vapor Deposition”